US EditionBurning Out? An E-Tattoo Can Track Mental Strain
- Researchers developed a wireless temporary e-tattoo applied to the forehead that reads brainwaves to track mental strain, reported May 29, 2025.
- The device arose from long-standing efforts to monitor physical health, now addressing the previously untracked mental strain affecting job performance.
- The e-tattoo features stretchable sensors and a lightweight battery, capturing brainwave patterns linked to cognitive load and fatigue during memory tests on six individuals.
- An AI program trained on these signals distinguishes mental workload levels and predicts potential mental overload, while the system costs roughly $220 versus $15,000 for traditional EEG equipment.
- Researchers aim to enable full scalp coverage by combining the tattoo with ink-based sensors for hairy skin, potentially transforming workplace well-being monitoring in focus-critical jobs.
25 Articles
25 Articles
Non-permanent wireless forehead e-tattoo measures mental strain
Researchers gave participants face tattoos that can track when their brain is working too hard. Published May 29 in the Cell Press journal Device, the study introduces a non-permanent wireless forehead e-tattoo that decodes brainwaves to measure mental strain without bulky headgear.
Temporary Forehead E-Tattoo Can Monitor Your Brain and Measure Stress Levels
A temporary tattoo that reads your mind sounds like something ripped from Netflix’s Altered Carbon, but researchers at the University of Texas at Austin have made it real. This isn’t about inking your face for style—it’s a paper-thin, wireless device that sticks to your forehead and tracks your brain’s activity, promising to keep tabs on [...]
Study Claims Electronic Face Tattoos Can Help Manage Stress At Work
A revolutionary/goofy-looking wireless forehead e-tattoo has been developed that can accurately estimate mental workloads in real-time, offering a significant leap forward for human-in-the-loop systems in high-stakes environments. This groundbreaking device, detailed in an article in the August 15 issue of Device by authors Heeyong Huh, Hyonyoung
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