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Machine Vision Software Includes Deep Learning-Based Bin Picking – Metrology and Quality News - Online Magazine

Summary by Metrology and Quality News - Online Magazine
MVTec Software GmbH has launched a new version of MVTec HALCON which includes numerous improvements as well as a new technology that combines deep learning algorithms with classic methods. The post Machine Vision Software Includes Deep Learning-Based Bin Picking appeared first on Metrology and Quality News - Online Magazine.
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Metrology and Quality News - Online Magazine broke the news in on Tuesday, June 3, 2025.
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