US EditionCross-Node Scaling Potential of SOT-MRAM for Last-Level Caches (imec)
Summary by Semiconductor Engineering
This story is only covered by news sources that have yet to be evaluated by the independent media monitoring agencies we use to assess the quality and reliability of news outlets on our platform. Learn more here.1 Articles
1 Articles
Cross-Node Scaling Potential of SOT-MRAM for Last-Level Caches (imec)
A new technical paper titled “SOT-MRAM Bitcell Scaling with BEOL Read Selectors: A DTCO Study” was published by researchers at imec, Leuven, and 3001 Belgium. Abstract “This work explores the cross-node scaling potential of SOT-MRAM for last-level caches (LLCs) under heterogeneous system scaling paradigm. We perform extensive Design-Technology Co-Optimization (DTCO) exercises to evaluate the bitcell footprint for different cell configurations at…
Coverage Details
Total News Sources1
Leaning Left0Leaning Right0Center0Last UpdatedBias DistributionNo sources with tracked biases.
Bias Distribution
- There is no tracked Bias information for the sources covering this story.
Factuality
To view factuality data please Upgrade to Premium
