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Scientists Achieve Record Conductivity in Silicon Chip Material
Researchers developed a nanometre-thin germanium-on-silicon material with hole mobility of about 7.15 million cm²/Vs, surpassing industrial silicon conductivity.
On November 24, Materials Today published that University of Warwick Semiconductors Research Group and National Research Council of Canada measured record hole mobility of 7.15 million cm2/Vs in nanometre-thin compressively strained germanium-on-silicon material.
Faced with silicon's limits, researchers revived germanium for its superior properties and compatibility with mainstream silicon manufacturing to enable faster, lower-power electronics.
Using a nanometre-thin germanium layer on silicon, the team grew a nanometre-thin compressively strained germanium epilayer and applied precise compressive strain to produce an ultra-clean crystal, Dr Maksym Myronov said.
Dr Sergei Studenikin, Principal Research Officer, said 'This sets a new benchmark for charge transport in group-IV semiconductors', marking a major milestone for Warwick and reinforcing UK leadership.
Researchers highlight potential uses in quantum information processing, spin qubits, cryogenic controllers, AI and data-centre hardware, as the material could enable faster, energy-efficient future chips and quantum devices.