Skip to main content
See every side of every news story
Published loading...Updated

Low Temperature Cu-Cu Bonding for Advanced Packaging (NYCU)

A new technical paper titled “Thermal stability enhancement of low temperature Cu-Cu bonding using metal passivation technology for advanced electronic packaging” was published by researchers at National Yang Ming Chiao Tung University. Abstract “This work investigates the thermal stability of Cu-Cu bonding using a thin Ag passivation layer in applications targeting advanced packaging. Conventional Cu-Cu bonding often requires elevated temperatu…
DisclaimerThis story is only covered by news sources that have yet to be evaluated by the independent media monitoring agencies we use to assess the quality and reliability of news outlets on our platform. Learn more here.Cross Cancel Icon

Bias Distribution

  • There is no tracked Bias information for the sources covering this story.

Factuality Info Icon

To view factuality data please Upgrade to Premium

Ownership

Info Icon

To view ownership data please Upgrade to Vantage

Semiconductor Engineering broke the news in on Sunday, January 18, 2026.
Too Big Arrow Icon
Sources are mostly out of (0)
News
Feed Dots Icon
For You
Search Icon
Search
Blindspot LogoBlindspotLocal