US EditionDomain Adaptation for Image Classification of Defects in Semiconductor Manufacturing (Infineon, U. Padova et al.)
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Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing (Infineon, U. Padova et al.)
A new technical paper titled “Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing” was published by researchers at Infineon Technologies, University of Padova and University of Bologna. Abstract “In the semiconductor sector, due to high demand but also strong and increasing competition, time to market and quality are key factors in securing significant market share in various application areas. Thanks to the succ…
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