Skip to main content
See every side of every news story
Published loading...Updated

Considerations For The Introduction of New EUV Resist Materials To A Fab (KU Leuven, imec)

A new technical paper titled “Process and materials compatibility considerations for introducing novel extreme ultraviolet resists in a fab: a guide for academia and entrepreneurs” was published by researchers at KU Leuven and imec. Abstract Excerpt “Despite having novel ideas, most researchers struggle to introduce their resist into an advanced fab, i.e., a facility where all the industrial-scale equipment for chip-making is present. The primar…
DisclaimerThis story is only covered by news sources that have yet to be evaluated by the independent media monitoring agencies we use to assess the quality and reliability of news outlets on our platform. Learn more here.Cross Cancel Icon

Bias Distribution

  • There is no tracked Bias information for the sources covering this story.

Factuality Info Icon

To view factuality data please Upgrade to Premium

Ownership

Info Icon

To view ownership data please Upgrade to Vantage

Semiconductor Engineering broke the news in on Thursday, January 15, 2026.
Too Big Arrow Icon
Sources are mostly out of (0)
News
Feed Dots Icon
For You
Search Icon
Search
Blindspot LogoBlindspotLocal