US EditionPublished • loading... • Updated
Aging Aware Steepening Metric for the Fault Coverage of a Test Set (Purdue Univ.)
Summary by Semiconductor Engineering
This story is only covered by news sources that have yet to be evaluated by the independent media monitoring agencies we use to assess the quality and reliability of news outlets on our platform. Learn more here.1 Articles
1 Articles
Aging Aware Steepening Metric for the Fault Coverage of a Test Set (Purdue Univ.)
A new technical paper titled “Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set” was published by researchers at Purdue University. Abstract “Chip aging may result in hardware defects whose likelihood of occurrence depends on the layout and functional workload at the defect site. In-field testing is important for the detection of defects that occur because of aging. In-field test periods have different …
Coverage Details
Total News Sources1
Leaning Left0Leaning Right0Center0Last UpdatedBias DistributionNo sources with tracked biases.
Bias Distribution
- There is no tracked Bias information for the sources covering this story.
Factuality
To view factuality data please Upgrade to Premium
