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Statistical BER Analysis For Two Types Of Communication Systems In Chiplet Integration (TSMC)

An new technical paper titled “Fast and Accurate Jitter Modeling for Statistical BER Analysis for Chiplet Interconnect and Beyond” was published by researchers at TSMC. Abstract “In this paper, we investigate Statistical Bit Error Rate (BER) analysis for low-loss short-reach chiplet interface and high-loss long-reach serial interface. We used jitter filtering to account for the residue jitter not tracked by a forwarded clock system and proposed …
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Semiconductor Engineering broke the news in on Friday, August 1, 2025.
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