US EditionR&D: Modeling Methodology for Thermo-Structural Analysis of V-NAND Flash Memory Structure
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R&D: Modeling Methodology for Thermo-Structural Analysis of V-NAND Flash Memory Structure
Scientific Reports has published an article written by Yongha Kim, Seungjun Ryu, and Sungryung Lee, School of Mechanical Engineering, Chungnam National University, Daejeon, 34134, Republic of Korea. Abstract: “This study proposes modeling methodology based on a continuous model for conducting thermo-electric-structural analyses of V-NAND flash memory structure under the Joule heating effect. The modeling methodology […] The post R&D: Modeling Me…
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