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Park Systems Expands FX Large Sample AFM Lineup to Power Next-Gen Industrial Innovation

Park Systems has launched an expanded FX Large Sample AFM series, including the Park FX300, at SEMICON Korea 2025, aimed at 300 mm wafer analysis and superior performance in large-sample atomic force microscopy technology.
The Park FX300 is designed for high-precision analysis, allowing researchers to examine nanoscale structures without damaging wafer surfaces.
Dr. Sang-Joon Cho stated that the new series optimizes wafer analysis for both industrial and research fields, defining new boundaries in AFM applications.
Park Systems underscores its dedication to advancing nanoscience through its optimized FX Large Sample AFM series, continuing to cultivate relationships with clients across multiple sectors including semiconductors and life sciences.

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Olean Times Herald

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Park Systems Expands FX Large Sample AFM Lineup to Power Next-Gen Industrial Innovation

SEOUL, South Korea, Feb. 18, 2025 /PRNewswire/ -- Park Systems, a global leader in atomic force microscopy (AFM), has unveiled an expanded FX Large Sample AFM series at SEMICON Korea 2025. Building on the success of Park FX200, which debuted…

3 days ago·Olean, United States

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