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Northrop Grumman Accelerates Microelectronics Testing Under DARPA Program
Summary by Semiconductor Digest
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Northrop Grumman Accelerates Microelectronics Testing Under DARPA Program
Northrop Grumman Corporation (NYSE: NOC) has demonstrated a secure testing environment for microelectronics used in radiation-prone areas, such as space and nuclear facilities, under DARPA’s Advanced Sources for Single-event Effects Radiation Testing (ASSERT) program. This innovation can drastically reduce wait times faced at national testing facilities from years to months. Microelectronics used in space and nuclear environments must be radiati…
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