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New tool speeds flaw detection in diamond and advanced semiconductors

Summary by Nanowerk
A software workflow automates X-ray analysis to spot crystal defects in diamond and advanced semiconductors, helping improve electronics and quantum devices.
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NanowerkNanowerk

New tool speeds flaw detection in diamond and advanced semiconductors

A software workflow automates X-ray analysis to spot crystal defects in diamond and advanced semiconductors, helping improve electronics and quantum devices.

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Nanowerk broke the news on Friday, June 26, 2026.
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