Infinitesima Begins Project to Further Develop the Capabilities of the Metron3D 300 mm In-line Wafer Metrology System

Infinitesima Begins Project to Further Develop the Capabilities of the Metron3D 300 mm In-line Wafer Metrology System

ABINGDON, United Kingdom, July 22, 2025 (GLOBE NEWSWIRE) -- Infinitesima is pleased to announce a three-year development project with partners including ASML. The Metron3D 300 mm in-line wafer metrology system will be used to optimise and explore metrology solutions for cutting-edge applications, including hybrid bonding, high-NA EUV lithography and 3D logic device structures such as complementary field-effect transistors (CFETs). This project w…

Infinitesima Begins Project to Further Develop the Capabilities of the Metron3D 300mm In-line Wafer Metrology System - Semiconductor Digest

Infinitesima announced a three-year development project with partners including ASML. The Metron3D 300 mm in-line wafer metrology system will be used to optimise and explore metrology solutions for cutting-edge applications, including hybrid bonding, high-NA EUV lithography and 3D logic device structures such as complementary field-effect transistors (CFETs). This project will combine the extensive expertise of the project partners with Infinite…