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Duel Microscope and Measuring Machine In Single Package – Metrology and Quality News - Online Magazine

Summary by Metrology and Quality News - Online Magazine
ZEISS has announced the expansion of its portfolio in the field of optical and tactile measurement technology with the introduction of ZEISS O-INSPECT duo. This innovative solution combines precise measurement technology with high-resolution microscopic inspection, enabling the examination of both large and small components in a single device. The post Duel Microscope and Measuring Machine In Single Package appeared first on Metrology and Qualit…
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Metrology and Quality News - Online Magazine broke the news in on Monday, November 25, 2024.
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