New Microtronic WaferWeight Precisely Monitors Semiconductor Wafer Mass During Macro Defect Inspection

New Microtronic WaferWeight Precisely Monitors Semiconductor Wafer Mass During Macro Defect Inspection

HAWTHORNE, N.Y., July 9, 2025 /PRNewswire/ -- Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as defects are being…

New Microtronic WaferWeight Monitors Semiconductor Wafer Mass During Macro Defect Inspection - Semiconductor Digest

Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as defects are being inspected – all on a single tool. This patented capability is called WaferWeight and it integrates fully into Microtronic’s EAGLEview line of high-speed macro defect inspection systems. It can be added to the latest EAGLEview 6 and also …