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New Microtronic WaferWeight Precisely Monitors Semiconductor Wafer Mass During Macro Defect Inspection

HAWTHORNE, N.Y., July 9, 2025 /PRNewswire/ -- Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as defects are being…

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Kilgore News Herald broke the news in on Wednesday, July 9, 2025.
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