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ZEISS VersaXRM 5 Insight Accelerates Hybrid 3D X-Ray
The system combines microCT and X-ray microscopy with guided workflows and automated AI-assisted reconstruction for faster non-destructive 3D imaging.
ZEISS introduced the VersaXRM 5 Insight, a hybrid 3D X-ray microscope designed to help researchers and engineers understand samples faster. The system combines large field-of-view and high-resolution imaging in one platform.
By combining X-ray microscopy and microCT, the system enables non-destructive imaging of large-scale structures and fine internal features. This approach protects delicate specimens by eliminating the need to cut or trim samples.
The system features ZEN navx, an intuitive software environment with intelligent guidance and sample-aware navigation to reduce setup time. FAST Mode adds rapid imaging feedback, while Resolution at a Distance enables high-resolution imaging of small features within larger samples.
Dr. Keith Duncan, Research Scientist and Director of X-ray Imaging at the Danforth Plant Science Center, praised the system's practical path for teams needing productivity and advanced 3D imaging capability. It supports diverse applications in materials research and industrial inspection.
Generating almost 12 billion euros in annual revenue, ZEISS invests 14 percent of its income in research and development. With over 47,400 employees globally, the company continues advancing optics and related fields with sustainable technology solutions.